ED-XRF Spectrometers - Exporter, Importer & Manufacturer, Pune, India
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ED-XRF Spectrometers
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Product Code : 01

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Product Specification
X-Ray Spectrometers
A whole series of X-RAY instruments are available. Detailed specifications for each version are listed in the table below.

All devices measure according to ASTM B568, DIN 60 987 and ISO 3497.

HELMUT FISCHER has been making X-Ray Fluorescence systems to measure coating thickness and perform material analysis for more than 21 years. Through the exact treatment of all relevant processes involving the physical principles of the XRF measurement method and the use of the latest hardware and software technology FISCHER's X-Ray instruments deliver features not found elsewhere.

The unique Software WinFTM® Version 6 (V.6) is the heart of these instruments. It enables the measurement of very complex coating systems, without calibration standards and with a predicted measurement accuracy, as well as the analysis of materials with up to 24 elements with WinFTM® Version 6.

Typical applications are:
  • Single coatings of Zn, Ni,Cr, Cu, Ag, Au, Sn etc.
  • Binary alloy coatings such as SnPb, ZnNi and NiP on Fe.
  • Ternary alloy coatings such as AuCdCu on Ni.
  • Double coatings such as Au/Ni on Cu, Cr/Ni on Cu, Au/Ag on Ni, Sn/Cu on brass, etc.
  • Double coatings, where one layer is an alloy layer, such as Cr/Ni/Cu on plastic or iron.
  • Multiple coatings with up to 24 layers (with WinFTM® V.6 only).
  • Metallurgical alloys with up to 4 (or 24 - with V.6) constituent elements.
  • Analysis of metal ion concentration in plating solutions.
Technical Specifications

FISCHERSCOPE®
X-RAY
XUL(M)®
FISCHERSCOPE® 
X-RAY 
XDL®-B
FISCHERSCOPE®
X-RAY
XDLM®-C4
FISCHERSCOPE®
X-RAY
XDVM®-P
FISCHERSCOPE® 
X-RAY 
XDVM®-µ
(SD)
Measurement direction from bottom
to top
from top
to bottom
from top
to bottom
from top
to bottom
from top
to bottom
X-Ray tube type ( W: tungsten tube; MW: micro-focus tube W ) W or MW W MW MW MW
Adjustable high voltage 30kV; 40kV; 50kV
Slotted measurement chamber
Primary Ni and Al filter
Absorber Co optional with WM-version
Number of collimators W-version: 1
WM-version: 4
1 4 4 1
z-axis none none, or motorized or programmable motorized or programmable programmable programmable
Type of test stage fixed plate or
optional manual XY-stage
fixed plate
or
manual XY-stage or
programmable XY-stage
manual XY-stage or
programmable XY-stage
programmable XY-stage programmable XY-stage
Magnification of test spot 38 - 184 x 20 - 180 x 20 - 180 x 20 - 180 x 30 - 1108 x
DCM method (Distance Controlled Measurement)
WinFTM® version V.3 standard
V.6 optional
V.3 standard
V.6 optional
V.3 standard
V.6 optional
V.3 standard
V.6 optional
V.6 standard
Operating system Windows XP prof.
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Feritscope
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Bench Top Unit CU Thickness on PCB & PTH
Bench Top Unit CU Thickness on PCB & PTH
Couloscope - STEP Measurement
Couloscope - STEP Measurement
Poroscope
Poroscope
 
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CONTACT DETAILS
Survey No. 41, Keshav Nagar, Mundhwa,Pune - 411036, Maharashtra, India
Phone:91-20-26822065/26810063/65256646/26801310
Fax:91-20-26822075/26801312
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Mrs. Winne Fonseca (Manager)
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